J.J. Sidorowich: search on Z-Library

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1

The analysis of observed chaotic data in physical systems

Abarbanel, Henry, Brown, Reggie, Sidorowich, John, Tsimring, Lev

Journal:

Review of Modern Physics

Year:

1993

Language:

english

File:

PDF, 3.08 MB

english, 1993

2

Randomized Controlled Trial of Yogic Meditation Techniques for Patients With Obsessive-Compulsive Disorder

Shannahoff-Khalsa, David S., Ray, Leslie E., Levine, Saul, Gallen, Christopher C., Schwartz, Barry J., Sidorowich, John J.

Journal:

Year:

1999

Language:

english

File:

PDF, 19.49 MB

english, 1999

3

Predicting chaotic time series

Farmer, J. Doyne, Sidorowich, John J.

Journal:

Physical Review Letters

Year:

1987

Language:

english

File:

PDF, 266 KB

english, 1987

4

Multiple scattering in stratified inhomogeneous media

J.J Sidorowich, W.H Wells

Journal:

Journal of Computational Physics

Year:

1985

Language:

english

File:

PDF, 935 KB

english, 1985

5

Predicting physical variables in time-delay embedding

Abarbanel, Henry D. I., Carroll, T. A., Pecora, L. M., Sidorowich, J. J., Tsimring, L. S.

Journal:

Physical Review E

Year:

1994

File:

PDF, 2.09 MB

1994

6

Anisotropic multiple scattering of collimated irradiance

W.H Wells, J.J Sidorowich

Journal:

Annals of Physics

Year:

1982

Language:

english

File:

PDF, 1.49 MB

english, 1982

7

Computational techniques for radiative transfer by spherical harmonics

Willard H. Wells, John J. Sidorowich

Journal:

Journal of Quantitative Spectroscopy and Radiative Transfer

Year:

1985

Language:

english

File:

PDF, 605 KB

english, 1985

8

Optimal shadowing and noise reduction

J. Doyne Farmer, John J. Sidorowich

Journal:

Physica D: Nonlinear Phenomena

Year:

1991

Language:

english

File:

PDF, 1.32 MB

english, 1991

9

Repellors attract attention

Sidorowich, John J.

Journal:

Year:

1992

File:

PDF, 277 KB

1992

10

Simultaneous measurement of six layers in a silicon on insulator film stack using visible-near-IR spectrophotometry and single-wavelength beam profile reflectometry

J.M. Leng, J.J. Sidorowich, M. Senko, J. Opsal

Journal:

Thin Solid Films

Year:

1998

Language:

english

File:

PDF, 339 KB

english, 1998

11

Simultaneous measurement of six layers in a silicon on insulator film stack using spectrophotometry and beam profile reflectometry

Leng, J. M., Sidorowich, J. J., Yoon, Y. D., Opsal, J., Lee, B. H., Cha, G., Moon, J., Lee, S. I.

Journal:

Journal of Applied Physics

Year:

1997

Language:

english

File:

PDF, 550 KB

english, 1997

12

[IEEE [Proceedings] ICASSP-92: 1992 IEEE International Conference on Acoustics, Speech, and Signal Processing - San Francisco, CA, USA (1992.03.23-1992.03.26)] [Proceedings] ICASSP-92: 1992 IEEE International Conference on Acoustics, Speech, and Signal Processing - Modeling of chaotic time series for prediction, interpolation, and smoothing

Sidorowich, J.J.

Year:

1992

Language:

english

File:

PDF, 419 KB

english, 1992

13

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III - Spectrophotometry and beam profile reflectometry measurement of six layers in an SOI film stack

Leng, JingMin, Sidorowich, John J., Yoon, Y. D., Opsal, Jon L., Lee, B. H., Cha, Giho, Moon, Joo-Tae, Lee, Sang-In, DeBusk, Damon K., Chen, Ray T.

Year:

1996

Language:

english

File:

PDF, 131 KB

english, 1996

14

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components - Multidomain genetic algorithm (MDGA) and its applications to thin film metrology

Leng, JingMin, Sidorowich, John J., Opsal, Jon L., Duparr, Angela, Singh, Bhanwar

Year:

2002

Language:

english

File:

PDF, 480 KB

english, 2002